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Abstract: X-ray diffraction (XRD) is a robust non-destructive technique for characterizing crystalline materials. It provides data on structures, phases, most well- liked crystal orientations (texture), and various structural parameters, like average grain size, crystallinity, strain, and crystal defects. XRD peaks are made by constructive interference of a monochromatic beam of X-rays scattered at specific angles from every set of lattice planes in the sample. The intensities of peak intensities are determined by the distribution of atoms inside the lattice. Consequently, the diffraction pattern is the fingerprint of periodic atomic arrangements in a very given material. This review summarizes the scientific trends related to the fast development of the technique of diffraction over the past 5 years touching on the fields of prescribed drugs, rhetorical science, geologic applications, micro-electronics, and glass producing, also in corrosion analysis.